→ rdfs:label → "CamScan CS3200 Scanning Electron Microscope + parts"^^xsd:string
→ dcterms:description → "Scanning electron microscope (LaB6 source; 0-50 keV) equipped for VI-NIR spectroscopic analysis and angle-resolved mapping of electron-induced light emission (cf. cathodoluminescence)"^^xsd:string
→ skos:notation → "E10514"^^http://id.southampton.ac.uk/ns/equipment-code-scheme
→ rdfs:comment → "Scanning electron microscope (LaB6 source; 0-50 keV) equipped for VI-NIR spectroscopic analysis and angle-resolved mapping of electron-induced light emission (cf. cathodoluminescence)"^^xsd:string
→ dc:description → "Scanning electron microscope (LaB6 source; 0-50 keV) equipped for VI-NIR spectroscopic analysis and angle-resolved mapping of electron-induced light emission (cf. cathodoluminescence)"^^xsd:string
→ rdfs:label → "University of Southampton"^^xsd:string
→ rdfs:label → "Physical Sciences and Engineering"^^xsd:string
→ rdfs:label → "Optoelectronics Research Centre"^^xsd:string