CamScan CS3200 Scanning Electron Microscope + parts
Scanning electron microscope (LaB6 source; 0-50 keV) equipped for VI-NIR spectroscopic analysis and angle-resolved mapping of electron-induced light emission (cf. cathodoluminescence)
| Facility: | http://id.southampton.ac.uk/facility/F10000 |
| Part of: | Physical Sciences and Engineering Optoelectronics Research Centre |
| Location: | New Mountbatten |
Contact
MACDONALD, KEVIN
+442380593085
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